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Instrumentation and processes are being developed to grow and anneal thin films, interfaces, and embedded clusters on nanoscale sized (10-100nm) apexes of specially prepared tungsten tips.
This is conducted in an ultra-high vacuum (UHV) scanning electron microscope (SEM) with the aim to provide superior samples for transmission electron microscopy (TEM) atomic scale tomography. Similar technology is being developed for thinning and post-processing of focused ion beam (FIB) lift-out pillars in UHV.
This effort is underpinned by ongoing fundamental research in epitaxy and ultrathin film growth dynamics by various surface science methods including low energy electron microscopy (LEEM) and diffraction (LEED).
Surface Science at the Nanoscale
Alloys including quasicrystals
Electron microscopy
Epitaxial growth
This is conducted in an ultra-high vacuum (UHV) scanning electron microscope (SEM) with the aim to provide superior samples for transmission electron microscopy (TEM) atomic scale tomography. Similar technology is being developed for thinning and post-processing of focused ion beam (FIB) lift-out pillars in UHV.
This effort is underpinned by ongoing fundamental research in epitaxy and ultrathin film growth dynamics by various surface science methods including low energy electron microscopy (LEEM) and diffraction (LEED).
Surface Science at the Nanoscale
Alloys including quasicrystals
Electron microscopy
Epitaxial growth
研究兴趣
论文共 73 篇作者统计合作学者相似作者
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