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Wenping Wang (S'06) received the B.S. and M.S. degrees from Changchun University of Science and Technology, Changchun, China, in 2000 and 2003, respectively, and the Ph.D. degree in electrical engineering from Arizona State University, Tempe, in 2008.
She worked as a research assistant at Peking University, Beijing, China, from 2001 to 2003. She is currently with Vitesse Semiconductor Corporation, Austin, TX, as a Reliability Engineer. Her current research interests include modeling of transistor and circuit reliability degradation, particularly negative bias temperature instability (NBTI) and hot carrier injection (HCI) effects, development of aging simulation flow for both digital and analog circuits, and design solutions for circuit aging.
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IEEE Transactions on Very Large Scale Integration (VLSI) Systemsno. 2 (2010): 173-183
FOUNDATIONS AND TRENDS IN ELECTRONIC DESIGN AUTOMATIONno. 4 (2010): 305-401
San Jose, CApp.19-26, (2009)
DATE '09: Proceedings of the Conference on Design, Automation and Test in Europepp.328-+, (2009)
International Journal of Parallel Programmingno. 4 (2009): 417-431
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