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Wangqi Qiu
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Papers22 papers
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IEEE Trans. on CAD of Integrated Circuits and Systems, no. 10 (2016): 1721-1729
ITC, pp.1-10, (2006)
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, no. 12 (2006): 1924-1929
Cited by88EIWOSBibtex
Fault simulation and test generation for small delay faults, (2006)
EIBibtex
IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, pp.98-103, (2005)
ITC, (2005)
VTS, pp.235-240, (2005)
ISQED, pp.276-280, (2004)
international symposium on quality electronic design, (2004)
DBT '04 Proceedings of the 2004 IEEE International Workshop on Defect Based Testing, pp.61-66, (2004)
MTV, pp.97-102, (2004)
ITC, pp.223-231, (2004)
VTS, pp.37-42, (2004)
ACM Trans. Design Autom. Electr. Syst., no. 4 (2003): 546-559
ITC, pp.592-601, (2003)
DFT, pp.79-79, (2003)
MTV, pp.19-24, (2003)
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