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IEEE Trans. on CAD of Integrated Circuits and Systems, no. 10 (2016): 1721-1729
EIWOS
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, no. 12 (2006): 1924-1929
EIWOS
Fault simulation and test generation for small delay faults, (2006)
EI
IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, pp.98-103, (2005)
EIWOS
international symposium on quality electronic design, (2004)
DBT '04 Proceedings of the 2004 IEEE International Workshop on Defect Based Testing, pp.61-66, (2004)
EI
ITC, pp.223-231, (2004)
EI
ACM Trans. Design Autom. Electr. Syst., no. 4 (2003): 546-559
EI
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