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排名必读论文期刊顶会热点AI 简史溯源树小脉星探人才迁徙塔尖人才国防情报追踪开源工具智慧手语
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论文共 309 篇作者统计合作学者相似作者

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Cross-talk of a large-scale depleted monolithic active pixel sensor (DMAPS) in 180 nm CMOS technology
Lars Schall,Christian Bespin,Ivan Caicedo,Jochen Dingfelder,Tomasz Hemperek,Toko Hirono,Fabian Hügging,Hans Krüger,Konstantinos Moustakas,Heinz Pernegger,Petra Riedler,Walter Snoeys,
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipmentpp.169381, (2024)
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Development of the radiation-hard MALTA CMOS sensor for tracking applications
Giuliano Gustavino,Phil Allport, Ignacio Asensi Tortajada, Prafulla Behera,Dumitru Vlad Berlea,Daniela Bortoletto,Craig Buttar,Florian Dachs,Valerio Dao, Ganapati Dash,Dominik Dobrijevic, Lucian Fasselt,
Proceedings of The 32nd International Workshop on Vertex Detectors — PoS(VERTEX2023) (2024)
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Characterisation of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process
Gianluca Aglieri Rinella, Giacomo Alocco,Matias Antonelli, Roberto Baccomi,Stefania Maria Beole, Mihail Bogdan Blidaru, Bent Benedikt Buttwill, Eric Buschmann,Paolo Camerini, Francesca Carnesecchi,Marielle Chartier, Yongjun Choi,
arxiv（2024）
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Simulations and performance studies of a MAPS in 65 nm CMOS imaging technology
Adriana Simancas,Justus Braach, Eric Buschmann,Ankur Chauhan,Dominik Dannheim, Manuel Del Rio Viera,Katharina Dort, Doris Eckstein, Finn Feindt, Ingrid-Maria Gregor,Karsten Hansen,Lennart Huth,
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipmentpp.169414, (2024)
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Digital pixel test structures implemented in a 65 nm CMOS process
Gianluca Aglieri Rinella,Anton Andronic,Matias Antonelli,Mauro Aresti,Roberto Baccomi,Pascal Becht,Stefania Beole,Justus Braach, Matthew Daniel Buckland, Eric Buschmann,Paolo Camerini,Francesca Carnesecchi,
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT (2023): 168589-168589
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Design and readout architecture of a monolithic binary active pixel sensor in TPSCo 65 nm CMOS imaging technology
L. Cecconi, F. Piro,J.L.A. de Melo, W. Deng, G.H. Hong,W. Snoeys, M. Mager,M. Suljic, T. Kugathasan, M. Buckland,G. Aglieri Rinella,P.V. Leitao,
Journal of Instrumentationno. 02 (2023): C02025-C02025
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Measurements of total ionizing dose effects in TPSCo 65 nm and influence of NMOS bulk bias
A. Dorda Martin,R. Ballabriga, G. Borghello,M. Campbell, W. Deng, G. H. Hong, I. Kremastiotis,W. Snoeys, G. Termo
JOURNAL OF INSTRUMENTATIONno. 2 (2023): C02036-C02036
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