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Wai Kin Chim received his B.Eng. and Ph.D. degrees in electrical engineering from the National University of Singapore in 1985 and 1991, respectively. From 1985 to 1988, he worked at the Defence Science Organisation of the Singapore Ministry of Defence. From 1989 to 1991, he was Manager of the Failure Analysis Laboratory at the Singapore Components Operation of Hewlett-Packard Singapore.
He joined the Department of Electrical Engineering, National University of Singapore (NUS), in 1991, where he is currently an Associate Professor. From 1994 to 2000, he was the Director of the Centre for Integrated Circuit Failure Analysis and Reliability at the Faculty of Engineering of NUS. From 2000 to 2007, he held a concurrent Fellowship appointment with the Singapore-Massachusetts Institute of Technology Alliance (SMA), where he was also the Course Coordinator of the Advanced Materials for Micro- and Nano-Systems Programme in SMA from 2002 to 2007.
His research interests are in the growth and characterization of nanostructures for memory application (e.g., nanocrystal memory, SONOS and RRAM), various areas of MOS technology (e.g., high-k and complex metal oxides, MOS device physics and reliability) and scanning capacitance microscopy. He has published more than 200 technical papers in refereed journals and international conference proceedings and holds 6 U.S., 1 European and 4 Singapore patents. He authored the book “Semiconductor Device and Failure Analysis Using Photon Emission Microscopy”, which was published by John Wiley & Sons Ltd (Chichester, England) in year 2000.
Dr. Chim was the recipient of the 4th Institution of Engineers Singapore Innovators Award in 1996, the Outstanding University Researcher Award from the National University of Singapore (NUS) in 1997, Best Paper Award in the area of Device Reliability at the 8th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits in 2001, and the NUS Nanoscience and Nanotechnology Initiative (NUSNNI) Inaugural Research Achievement Award in 2004.
He joined the Department of Electrical Engineering, National University of Singapore (NUS), in 1991, where he is currently an Associate Professor. From 1994 to 2000, he was the Director of the Centre for Integrated Circuit Failure Analysis and Reliability at the Faculty of Engineering of NUS. From 2000 to 2007, he held a concurrent Fellowship appointment with the Singapore-Massachusetts Institute of Technology Alliance (SMA), where he was also the Course Coordinator of the Advanced Materials for Micro- and Nano-Systems Programme in SMA from 2002 to 2007.
His research interests are in the growth and characterization of nanostructures for memory application (e.g., nanocrystal memory, SONOS and RRAM), various areas of MOS technology (e.g., high-k and complex metal oxides, MOS device physics and reliability) and scanning capacitance microscopy. He has published more than 200 technical papers in refereed journals and international conference proceedings and holds 6 U.S., 1 European and 4 Singapore patents. He authored the book “Semiconductor Device and Failure Analysis Using Photon Emission Microscopy”, which was published by John Wiley & Sons Ltd (Chichester, England) in year 2000.
Dr. Chim was the recipient of the 4th Institution of Engineers Singapore Innovators Award in 1996, the Outstanding University Researcher Award from the National University of Singapore (NUS) in 1997, Best Paper Award in the area of Device Reliability at the 8th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits in 2001, and the NUS Nanoscience and Nanotechnology Initiative (NUSNNI) Inaugural Research Achievement Award in 2004.
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APPLIED PHYSICS LETTERSno. 19 (2023)
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