William Vandendaele received the M.Sc. and Ph.D. degrees in electronics from INP-Grenoble, France, in 2007 and 2010, respectively. In 2011, he joined SOITEC Group as responsible for Research and Development Electrical Characterization where he studied SOI, III-V materials. Since 2014, he has been currently with the CEA-LETI, as an Expert Engineer in power devices electrical characterization.
He has co-authored over 30 papers and holds three patents. He is actively involved in the field of GaN devices characterization, from epitaxial to BEOL level and parasitic effects such as current collapse and reliability issues.