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Dr. Maly's research interests have been focused on the interfaces between VLSI design, testing and manufacturing with the stress on the stochastic nature of phenomena relating these three VLSI domains. He has authored, co-authored and edited a number of books, journal and conferences papers, as well as patents, which have attempted to promote integration of design, test and manufacturing. Among his publications addressing the above field are papers introducing: statistical process simulation, layout-oriented yield modeling, defect-based approaches to fault modeling (including inductive fault analysis) as well as new design for manufacturability CAD strategies and defect/quality oriented testing methodologies.
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Kent Fuchs,Jacob A. Abraham,Vishwani D. Agrawal, W. R. Bill Bottoms, Mel Breuer,Wojciech Maly,Sudhakar M. Reddy, Thomas W. Williams,David Yeh
semanticscholar(2014)
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