V Reshetnyak M. - Kharkov Polytech Inst, Natl Tech Univ

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论文共 14 篇作者统计合作学者相似作者

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Structure and Phase Formation Features of Ti-Zr-Ni Quasicrystalline Films under Heating

S. V. Malykhin,V. V. Kondratenko,I. А. Kopylets,S. V. Surovitskiy,А. А. Baturin,I. F. Mikhailov,M. V. Reshetnyak,S. S. Borisova,Yu. S. Bogdanov

Journal of Nano- and Electronic Physics（2019）

引用8浏览0引用

Growth and Structure of WC/Si Multilayer X-Ray Mirror

Y. P. Pershyn,V.S. Chumak, I.G. Shypkova,V.V. Mamon,A. Yu. Devizenko,В. В. Кондратенко,M.V. Reshetnyak,E. N. Zubarev

Voprosy Atomnoj Nauki i Tekhnikipp.69-76, (2018)

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GROWTH AND STRUCTURE OF WC/Si MULTILAYER X-RAY MIRROR

Y. P. Pershyn,V. S. Chumak, I. G. Shypkova,V. V. Mamon,A. Yu Devizenko,V. V. Kondratenko,V Reshetnyak M.,E. N. Zubarev

PROBLEMS OF ATOMIC SCIENCE AND TECHNOLOGY（2018）

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Rapid Diagnostics of Urinary Iodine Using a Portable EDXRF Spectrometer

I. F. Mikhailov,A. A. Baturin,A. I. Mikhailov,S. S. Borisova,M. V. Reshetnyak, D. I. Galata

Journal of X-Ray Science and Technology（2017）

引用1浏览0WOS引用

STRUCTURE EVOLUTION OF TUNGSTEN COATINGS EXPOSED TO PLASMA FLOWS UNDER ITER ELM RELEVANT CONDITIONS

S. V. Malykhin,S. V. Surovitskiy,V. A. Makhlaj,N. N. Aksenov,O. V. Byrka,S. S. Borisova,S. S. Herashchenko,V. V. Reshetnyak

PROBLEMS OF ATOMIC SCIENCE AND TECHNOLOGY（2017）

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X-ray Fluorescent Analysis of Iodin Traces in Urine

I.F. Mikhajlov,A. A. Baturin, A.I. Mikhajlov, S. S. Borisova,M.V. Reshetnyak, N.V. Shlyakhova, E.A. Budrejko, Д.І. Галата

openalex（2015）

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CHANGES OF STRUCTURE CHARACTERISTICS IN Ti41,5Zr41,5Ni17 AND Ti41,5Hf41,5Ni17 RAPIDLY QUENCHED RIBBONS UNDER RADIATION INFLUENCE

V. M. Azhazha,S. D. Lavrinenko,Yu. F. Lonin,M. M. Pylypenko, B. V. Sereda, S. V. Kryachko,S. V. Malykhin,A. T. Pugachov,M. V. Reshetnyak

PROBLEMS OF ATOMIC SCIENCE AND TECHNOLOGYpp.33-38, (2011)

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Changes of Structure Characteristics in Ti 41,5 Zr 41,5 Ni 17 and Ti 41,5 Hf 41,5 Ni 17 Rapidly Quenched Ribbons under Radiation Influence

V.M. Azhazha,S.D. Lavrinenko,Yu.F. Lonin,М.М. Pylypenko, B.V. Sereda, S.V. Kryachko,S.V. Malykhin,A. T. Pugachev,M.V. Reshetnyak

openalex（2011）

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Structure and Hardness of Ti-N and Ti-Si-N Coatings Deposited from The

В. В. Васильев,A.A. Luchaninov,E.N. Reshetnyak,V.E. Strel’nitskij,Г. Н. Толмачева,M. V. Reshetnyak

Voprosy Atomnoj Nauki i Tekhnikipp.173-180, (2009)

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STRUCTURE AND HARDNESS OF Ti-N AND Ti-Si-N COATINGS DEPOSITED FROM THE FILTERED VACUUM-ARC PLASMA

V. V. Vasil'ev,A. A. Luchaninov,E. N. Reshetnyak,V. E. Strel'nitskij, G. N. Tolmatcheva,M. V. Reshetnyak

PROBLEMS OF ATOMIC SCIENCE AND TECHNOLOGYpp.173-180, (2009)

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