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Ugur Çilingiroglu received the M. Sc. degree in electronics engineering from Istanbul Technical University, Istanbul, Turkey, in 1973 and the Ph.D. degree in microelectronics from Southampton University, Southampton, U.K., in 1978.
He held Assistant and Associate Professor and Professor positions at İstanbul Technical University between 1978 and 2001. He is presently a Professor with the Department of Electrical Engineering, Texas A&M University, College Station, where he was a Visiting Assistant Professor from 1985 to 1986 and an Assistant Professor from 1988 to 1991. Prior to 1984, he was a Consultant with the Turkish Scientific and Technological Research Council, where he contributed to the planning and implementation of a semiconductor technology R&D facility. From 1986 to 1988, he was a Consultant to Teletas A.S., where he organized industrial training courses on CMOS technology and ASIC design. He spent the summer of 1990 at Hewlett Packard, Manufacturing Test Division, where he invented the capacitive in-circuit testing technique known today as TestJet Technology. He also held the position of Academic Coordinator with ETA ASIC Design Center from 1991 to 1999, where he was responsible for the management of about 15 industrial ASIC design projects. He also was Head of the Department of Electronics and Communication Engineering, İstanbul Technical University in 1998. He holds seven patents and is the author of Systematic Analysis of Bipolar and MOS Transistors (Norwood, MA: Artech House, 1993). His research activity spans all aspects of microelectronics ranging from device physics and technology to integrated circuit design.
Dr. Çilingiroglu held a Fulbright Research Fellowship in the Department of Electrical Engineering, Texas A&M University in 1984. He received a CENTO Scholarship in 1973, an Eta Kappa Nu Outstanding Professor Award in 1990, and a Best Graduate Advisor Award from Turkish Technology Development Fund in 2001.
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论文共 36 篇作者统计合作学者相似作者
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2015 Computational Electromagnetics International Workshop (CEM)pp.1-2, (2015)
Proceedings of the 19th ACM Great Lakes symposium on VLSIpp.239-244, (2009)
Journal of Electronic Testingno. 1 (2007): 25-34
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