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Research Interests

Papers共 49 篇Author StatisticsCo-AuthorSimilar Experts

By YearBy Citation主题筛选期刊级别筛选合作者筛选合作机构筛选
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期刊级别
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Diagnosis of Double Faults Consisting of a Stuck-at Fault and a Transition Fault
Yoshinobu Higami,Tsutomu Inamoto,Senling Wang,Hiroshi Takahashi,Kewal K. Saluja
2024 INTERNATIONAL TECHNICAL CONFERENCE ON CIRCUITS/SYSTEMS, COMPUTERS, AND COMMUNICATIONS, ITC-CSCC 2024 (2024)
Cited0Views0EIWOSBibtex
0
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Improving of Fault Diagnosis Ability by Test Point Insertion and Output Compaction
Yoshinobu Higami,Tsutomu Inamoto,Senling Wang,Hiroshi Takahashi,Kewal K. Saluja
2023 International Technical Conference on Circuits/Systems, Computers, and Communications (ITC-CSCC)pp.1-5, (2023)
Cited0Views0EIWOSBibtex
0
0
IEEJ Electronics, Information and Systems Society
Hisashi Tamaki,Kenji Baba, Toshiyuki Ono, Ltd Hitachi, Akira Senga, Tepco Power Grid, Inc Kawauchi,Takashi Hirano, Nec Corp, S. Kitamura,Hiroyuki Nishikawa,Keita Tanaka,Yasue Mitsukura, Yusuke Watabe, Meidensha Corp, Masaaki Miyashita, Makoto Criepi,Tatsuya Nakae,Takuya Sato, Fujitsu Ltd, Kenta Fujimoto,Tsutomu Inamoto, Kozo Banno,Nobuhiko Nakano, Atsushi Fukumoto, K. Mori,Hiroshi Yamada,Chikahito Nakajima, Chiri Yamaguchi, Kensuke Kuraki, Toshiyuki Chairperson,Hirooki Aoki,Takashi Okamoto, Sensy Co, Ltd Kaihara, Yukio Goto, Toshimasa Harada,Katsutoshi Saeki,Masahiro Kurono, Takafumi Criepi, Takashi Fukumoto, Hitachi Ltd,Seiichi Koakutsu, Hiroshi Nakatani,Yasushi Ono
IEEJ Transactions on Electronics Information and Systemsno. 11 (2023): L11_1-L11_1
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Machine Learning Based Fault Diagnosis for Stuck-at Faults and Bridging Faults
Yoshinobu Higami, Takaya Yamauchi,Tsutomu Inamoto,Senling Wang,Hiroshi Takahashi,Kewal K. Saluja
2022 37th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) (2022)
Cited1Views0EIWOSBibtex
1
0
Preliminary Study on Noise-Resilient Artificial Neural Networks for On-Chip Test Generation
Tsutomu Inamoto, Tomoki Nishino,Senling Wang,Yoshinobu Higami,Hiroshi Takahashi
2022 IEEE 11th Global Conference on Consumer Electronics (GCCE) (2022)
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Preliminary Evaluation of Artificial Neural Networks As Test Pattern Generators for BIST
Tsutomu Inamoto, Kazuki Ohtomo,Yoshinobu Higami
2021 36th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) (2021)
Cited2Views0EIWOSBibtex
2
0
Compaction of Fault Dictionary Without Degrading Diagnosis Ability
Yoshinobu Higami, Tomokazu Nakamura,Tsutomu Inamoto,Senling Wang,Hiroshi Takahashi,Kewal K. Saluja
2021 36th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) (2021)
Cited1Views0EIWOSBibtex
1
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Regeneration of Test Patterns for BIST by Using Artificial Neural Networks
Tsutomu Inamoto,Yoshinobu Higami
35TH INTERNATIONAL TECHNICAL CONFERENCE ON CIRCUITS/SYSTEMS, COMPUTERS AND COMMUNICATIONS (ITC-CSCC 2020)pp.137-140, (2020)
Cited1Views0EIWOSBibtex
1
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Reduction of Fault Dictionary Size by Optimizing the Order of Test Patterns Application
Yoshinobu Higami,Tsutomu Inamoto,Senling Wang,Hiroshi Takahashi,Kewal K. Saluja
35TH INTERNATIONAL TECHNICAL CONFERENCE ON CIRCUITS/SYSTEMS, COMPUTERS AND COMMUNICATIONS (ITC-CSCC 2020)pp.131-136, (2020)
Cited0Views0EIWOSBibtex
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Author Statistics

#Papers: 49

#Citation: 152

H-Index: 6

G-Index: 11

Sociability: 4

Diversity: 2

Activity: 0

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