基本信息
浏览量:0
职业迁徙
个人简介
Toru Koyama was born in Kyoto City, Japan, in 1961. He received the B.S. degree from the Kyoto Institute of Technology, Kyoto, Japan, in 1984 and the Ph.D. degree in material and life science from Osaka University, Osaka, Japan, in 2002. He joined Mitsubishi Electric Corporation in 1984, where he was engaged in the development of failure analysis and fault isolation techniques for ULSI devices. From 2003 to 2010, he was a Senior Principal Engineer and a Manager of the failure analysis section of Renesas Technology Corporation. Since 2011, he has been a Senior Manager of the Analysis and Evaluation Technology Department, Renesas Semiconductor Manufacturing Co., Ltd. He has consistently been engaged in the development of physical and electrical analysis for the resolution of failures in ULSI devices. He has currently presided over the analysis and the evaluation for improving the production yield and quality of semiconductor devices. He was a Rating Committee Member of the International Symposium for Testing and Failure Analysis, and a Mentor of the IEEE International Reliability Physics Symposium during a certain period. He is a member of the Reliability Engineering Association of Japan and an Organization Committee Member of the Institute of Nano Testing.
研究兴趣
论文共 2 篇作者统计合作学者相似作者
按年份排序按引用量排序主题筛选期刊级别筛选合作者筛选合作机构筛选
时间
引用量
主题
期刊级别
合作者
合作机构
Yoshikazu Nagamura,Kenji Shiozawa,Toru Koyama,Jun Matsushima, Kazuhiro Tomonaga, Yutaka Hoshi, Shuji Nomura,Masayuki Arai,Kazuhiko Iwasaki
作者统计
合作学者
合作机构
D-Core
- 合作者
- 学生
- 导师
数据免责声明
页面数据均来自互联网公开来源、合作出版商和通过AI技术自动分析结果,我们不对页面数据的有效性、准确性、正确性、可靠性、完整性和及时性做出任何承诺和保证。若有疑问,可以通过电子邮件方式联系我们:report@aminer.cn