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when he joined the Central Research Laboratory, Varian Associates, Palo Alto, CA, USA. At Varian Associates, he worked on III–V semiconductor photocathodes, solar cells, and microwave devices, as well as on silicon molecular beam epitaxy and MOS process technology, until 1984. Since 1984, he has been with Intel Corporation, Santa Clara, CA, engaged in integrated circuit electrostatic discharge (ESD) protection, complementary metal–oxide–semiconductor latchup testing, fabrication process reliability, signal integrity, system ESD testing, and design and testing of standard IC layouts. He is currently a Senior Principal Engineer with Intel. He has received the Intel Achievement Award for his patented ESD protection devices, which have achieved breakthrough ESD performance enhancements for a wide variety of Intel products. He now holds 37 patents, with several more pending.,Dr. Maloney received Best Paper Awards for his contributions to the EOS/ESD Symposium in 1986 and 1990, was the General Chairman for the 1992 EOS/ESD Symposium, and received the ESD Association's Outstanding Contributions Award in 1995. He has taught short courses at the University of California, Los Angeles, CA, USA; the University of Wisconsin—Madison, WI, USA; and the University of California, Berkeley, CA, USA. He is the coauthor of the book “Basic ESD and I/O Design”
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论文共 43 篇作者统计合作学者相似作者
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2022 44th Annual EOS/ESD Symposium (EOS/ESD) (2022): 1-8
2021 43rd Annual EOS/ESD Symposium (EOS/ESD) (2021): 1-9
2020 42nd Annual EOS/ESD Symposium (EOS/ESD)pp.1-8, (2020)
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2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)pp.396-401, (2018)
Electrical Overstress Electrostatic Discharge Symposium (2016)
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