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职业迁徙
个人简介
Extensive test and design-for-test experience from a single transistor to billion transistor microprocessors. Experienced and solved IO High-Volume-Manufacturing test issues from Megahertz to tens of Gigahertz. Coached and mentored numerous engineers, researchers, academia and twice received “Outstanding Mentor Awards.” Quickly recognize industrial trends and key test obstacles for product designs. Broad organizational / industrial perspectives leading to identification and formation of alliance / collaboration with key technology players, achieving business goal. Strong team player, good listener (collect inputs / feedback from others to refine). Resilient self-starter that continuously looks for ways / alternatives to achieve goals. Risk taker, willing to take on unfamiliar roles and be flexible on project assignment for organizational needs.
Open for any consultant assignment.
Specialties: Test, Analog IO test, DFT, 2.5/3D test, program management
Open for any consultant assignment.
Specialties: Test, Analog IO test, DFT, 2.5/3D test, program management
研究兴趣
论文共 9 篇作者统计合作学者相似作者
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DFT '10 Proceedings of the 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systemspp.265-272, (2010)
Berkeley, CApp.441-446, (2007)
Lake Comopp.17-22, (2006)
DFT 2005: 20TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMSpp.169-177, (2005)
INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGSpp.100-109, (2002)
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D-Core
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