基本信息
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职业迁徙
个人简介
~25 years of industrial experience with semiconductor technology reliability,
10 years with semiconductor product reliability.
>35 technical publications, several IEEE IRPS tutorials, five technical book chapters.
13 patents issued.
IEEE Fellow, Distinguished Lecturer, IEEE EDS.
Recognized world expert in several CMOS reliability fields:
Energy driven Hot Carrier with carrier-carrier scattering and quasi-ballistic transport
Bias Temperature Instability induced statistical variations
Both are becoming extremely important for nanotechnology.
Specialties: Semiconductor Physics, CMOS device wearout and soft error rate, and reliability physics of failure.
10 years with semiconductor product reliability.
>35 technical publications, several IEEE IRPS tutorials, five technical book chapters.
13 patents issued.
IEEE Fellow, Distinguished Lecturer, IEEE EDS.
Recognized world expert in several CMOS reliability fields:
Energy driven Hot Carrier with carrier-carrier scattering and quasi-ballistic transport
Bias Temperature Instability induced statistical variations
Both are becoming extremely important for nanotechnology.
Specialties: Semiconductor Physics, CMOS device wearout and soft error rate, and reliability physics of failure.
研究兴趣
论文共 39 篇作者统计合作学者相似作者
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David F. Heidel, Paul W. Marshall,Jonathan A. Pellish,Kenneth P. Rodbell,Kenneth A. LaBel,James R. Schwank,Stewart E. Rauch, Mark C. Hakey,Melanie D. Berg, C.M. Castaneda,Paul E. Dodd, M. Friendlich,
IEEE Transactions on Nuclear Scienceno. 1 (2020): 11-13
Peter C. Paliwoda,Maria Toledano-Luque,Tanya Nigam,F. Guarin, M. Nour, S. Cimino,L. Pantisano,A. Gupta, O. H. Gonzalez,M. Hauser, W. Liu, A. Vayshenker,
Extreme Environment Electronicspp.455-458, (2017)
2016 46th European Solid-State Device Research Conference (ESSDERC)pp.428-431, (2016)
Bias Temperature Instability for Devices and Circuitspp.135-160, (2014)
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