Stephen J. Moxim

Stephen J. Moxim (Member, IEEE) received the bachelor’s degree in engineering science and mechanics from The Pennsylvania State University, where he is currently pursuing the Ph.D. degree in engineering science and mechanics. He has been working as a Research Assistant with the Semiconductor Spectroscopy Lab, Penn State since 2017. His research interests include the application of electrically detected magnetic resonance and near-zero-field magnetoresistance to semiconductor device reliability problems. He has authored/coauthored eight peer reviewed journal articles and submitted two more articles currently under review. He has contributed to 13 conference presentations.