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Shunhua Chang

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Predictive full circuit ESD simulation and analysis using extended ESD compact models: Methodology and tool implementation

Junjun Li,Robert J Gauthier,Amol Joshi,Martin Lundberg,John A Connor,Shunhua Chang,Souvick Mitra,Mujahid Muhammad

Electrical Overstress/ Electrostatic Discharge Symposium, pp.1-8E, (2010)

Cited by11EIWOSBibtex

Maximizing ESD design window by optimizing gate bias for cascoded drivers in 45nm and beyond SOI technologies

Souvick Mitra,Robert J Gauthier,Shunhua Chang,Junjun Li,Ralph Halbach, C Seguin

Electrical Overstress/ Electrostatic Discharge Symposium, pp.1-6E, (2010)

Cited by12EIWOSBibtex

ESD design automation & methodology to prevent CDM failures in 130 & 90 nm ASIC design systems

C J Brennan,Joseph N Kozhaya, Robert Proctor,Jeffrey Sloan,Shunhua Chang, James Sundquist, Terry Lowe,D Picozzi

Journal of Electrostatics, no. 2 (2006): 112-127

Cited by7Bibtex

ESD design automation for a 90nm ASIC design system

C J Brennan,Joseph N Kozhaya, Robert A Proctor,J Sloan,Shunhua Chang, James Sundquist, Troy Lowe

(2004)

Cited by10Bibtex

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