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Shravan K. Chaganti (S’17) received the B.Tech. degree in electronics and communication engineering from IIT Roorkee, Roorkee, India, in 2014. He is currently pursuing the Ph.D. degree in electrical and computer engineering with Iowa State University, Ames, IA, USA.
In 2016, he was an Intern with Skyworks Solutions, Cedar Rapids, IA, USA, where he was involved in analog circuit design, verification, and test. In 2018, he was an Intern with Texas Instruments, Sugarland, TX, USA, where he was involved in data converter linearity test time reduction. His current research interests include low-cost high-precision analog-to-digital converter (ADC)/digital-to-analog converter (DAC) testing, analog circuit design, and analog fault coverage simulation and improvement.
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JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONSno. 1 (2023): 57-69
J. Electron. Test.no. 6 (2022): 637-651
Kushagra Bhatheja,Shravan Chaganti,Degang Chen,Xiankun Robert Jin, Chris C Dao, Juxiang Ren,Abhishek Kumar, Daniel Correa, Mark Lehmann, Thomas Rodriguez, Eric Kingham, Joel R Knight,
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