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Robert J Gauthier
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Papers36 papers
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CICC, pp.1-4, (2020)
2020 IEEE International Reliability Physics Symposium (IRPS), pp.1-4, (2020)
Kyongjin Hwang, Sagar Premnath Karalkar, Vishal Ganesan, Sevashanmugam Marimuthu,Alban Zaka,Tom Herrmann, Bhoopendra Singh,Robert Gauthier
2020 IEEE International Reliability Physics Symposium (IRPS), pp.1-4, (2020)
international symposium on the physical and failure analysis of integrated circuits, (2019)
2019 IEEE International Reliability Physics Symposium (IRPS), pp.1-4, (2019)
international symposium on the physical and failure analysis of integrated circuits, (2019)
electrical overstress electrostatic discharge symposium, (2018)
Bibtex
electrical overstress electrostatic discharge symposium, (2018)
Bibtex
electrical overstress electrostatic discharge symposium, (2018)
Bibtex
IEEE Transactions on Device and Materials Reliability, no. 4 (2016): 497-503
EIWOSBibtex
(2015)
Cited by1Bibtex
(2014)
Cited by2Bibtex
System-on-Chip Conference, pp.109-114, (2014)
Electrical Overstress/Electrostatic Discharge Symposium, pp.1-8, (2013)
(2013)
Cited by5Bibtex
(2013)
Bibtex
(2012)
Cited by5Bibtex
(2012)
Cited by6Bibtex
Electrical Overstress/Electrostatic Discharge Symposium, pp.1-5, (2012)
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