R. Dean Adams

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test, (2013)

Memory Technology, Design and Testing, pp.92-95, (2004)

MTDT, pp.83-83, (2002)

San Francisco, CA, pp.366-374, (2001)

ITC, pp.776-782, (2001)

ITC, pp.547-547, (2000)

MTDT, pp.119-119, (2000)

VTS, pp.28-28, (1999)

Washington, DC, pp.356-362, (1998)

Washington, DC, pp.217-225, (1997)

ITC, pp.33-44, (1995)