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个人简介
Prof. van Aken’s research focuses on the atomic-scale characterization of interfaces, functional complex oxide hetero-structures, strained semiconductors, of optical properties of nanostructured thin films and plasmonic-active nanostructures, nanoparticles and nanomaterials, as well as of molecules on 2D materials. He uses and further develops the advanced scanning TEM techniques electron energy-loss spectroscopy, energy-dispersive X-ray spectroscopy, in-line electron holography, in-situ TEM methods, strain mapping, quantitative high-resolution TEM analysis, different quantitative electron diffraction techniques, image processing and simulation, and 4D-STEM, electron ptychography and tomography.
研究兴趣
论文共 613 篇作者统计合作学者相似作者
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ADVANCED MATERIALSpp.e2310817-e2310817, (2024)
ADVANCED FUNCTIONAL MATERIALSno. 4 (2024)
Nature Communicationsno. 1 (2024): 378-378
Prosper Ngabonziza, Anand Sharma, Anna Scheid, Sethulakshmi Sajeev,Peter A. van Aken,Jochen Mannhart
Physical Review Materialsno. 4 (2024)
Masoud Taleb, Paul Bittorf, Mximilian Black,Mario Hentschel,Wilfried Sigle,Benedikt Haas,Christoph Koch,Peter A. van Aken,Harald Giessen,Nahid Talebi
arxiv(2024)
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Solid State Ionics (2023): 116113
Ulrike Niemann,Yu-Mi Wu, Ryosuke Oka,Daigorou Hirai,Yi Wang,Y. Eren Suyolcu,Minu Kim,Peter A. van Aken,Hidenori Takagi
arxiv(2023)
Pascal Puphal, Pascal Reiss, Niklas Enderlein,Yu-Mi Wu,Giniyat Khaliullin, Vignesh Sundaramurthy, Tim Priessnitz, Manuel Knauft, Lea Richter,Masahiko Isobe,Peter A. van Aken,Hidenori Takagi,
arxiv(2023)
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arxiv(2023)
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