I'm a researcher at the Łukasiewicz Research Network – Institute of Microelectronics and Photonics, with over 15 years of experience in Secondary Ion Mass Spectrometry (SIMS). My scientific focus is on the in-depth characterization of complex, ultra-thin, and layered materials, particularly 2D materials and device structures. My most significant achievement to date has been the successful application of SIMS to study materials with layered architectures at atomic depth resolution, revealing structural and compositional details that were previously beyond reach. I currently use the CAMECA IMS SC Ultra tool, which enables depth profiling with sub-nanometer precision and supports my continuous pursuit of pushing the resolution frontier.

Since 2020, I have been leading the Characterization of Materials and Devices Research Group, where we combine cutting-edge instrumentation with tailored analytical strategies. I enjoy navigating the challenges of complex sample analysis – from the early design of experiments to meaningful data interpretation. I work closely with colleagues and partners across disciplines, and I strongly believe that the best science happens in cooperation.

Beyond the technical side, I use this space to share my perspective on the research process itself – the highs and lows of scientific work, the long-term dedication it requires, and the personal journey of growing as a scientist. Whether it's small practical tips or broader reflections on learning and perseverance, I’m always glad to exchange ideas. If you’re working with SIMS, materials science, or simply committed to doing deep and meaningful science, feel free to connect.