Paul S Mclaughlin

Binding

international interconnect technology conference, (2018)

IRPS, pp.4, (2018)

international electron devices meeting, (2018)

international interconnect technology conference, (2018)

international interconnect technology conference, pp.1-4, (2017)

international interconnect technology conference, pp.1-3, (2017)

international interconnect technology conference, pp.1-3, (2017)

international reliability physics symposium, (2017)

international interconnect technology conference, pp.89-91, (2016)

international interconnect technology conference, pp.31-33, (2016)

international interconnect technology conference, pp.2-4, (2016)

international reliability physics symposium, (2016)

international electron devices meeting, (2015)

international electron devices meeting, (2015)

international integrated reliability workshop, pp.52-55, (2015)

Electron Devices Meeting, pp.15.3.1-15.3.4, (2013)

IEEE Transactions on Device and Materials Reliability, no. 1 (2011): 86-91

Reliability Physics Symposium, pp.2F.2.1-2F.2.8, (2011)