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Paul S Mclaughlin
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Papers41 papers
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Koichi Motoyama,O. van der Straten,J. Maniscalco,H. Huang, Yb. Kim, Jk. Choi, Jh. Lee,C.-K. Hu,Paul S. McLaughlin,Theodorus E. Standaert, Roger A. Quon,Griselda Bonilla
international interconnect technology conference, (2018)
IRPS, pp.4, (2018)
C.-K. Hu,L. Gignac, G. Lian,C. Cabral, K. Motoyama,H. Shobha,J. Demarest, Y. Ostrovski, C. M. Breslin, M. Ali, J. Benedict,P. S. McLaughlin
international electron devices meeting, (2018)
P. Bhosale,J. Maniscalco,Nicholas A. Lanzillo,Takeshi Nogami,Donald F. Canaperi, Koichi Motoyama,H. Huang,Paul S. McLaughlin, R. Shaviv, M. Stolfi, R. Vinnakota, G. How
international interconnect technology conference, (2018)
Christopher J. Penny,Stephen M. Gates,Brown Peethala, Joe Lee,Deepika Priyadarshini,Son Van Nguyen,Paul S. McLaughlin,E. Liniger,C.-K. Hu, Lawrence A. Clevenger,Terence B. Hook,Hosadurga Shobha
international interconnect technology conference, pp.1-4, (2017)
Chih-Chao Yang,Terry A. Spooner,Paul S. McLaughlin,C.-K. Hu,H. Huang, Yann Mignot, M. Ali, G. Lian, Roger A. Quon,Theodorus E. Standaert,Daniel C. Edelstein
international interconnect technology conference, pp.1-3, (2017)
Takeshi Nogami, Raghuveer Patlolla,J. Kelly, Benjamin D. Briggs,H. Huang,J. Demarest, Jing Li, R. Hengstebeck,Xunyuan Zhang, G. Lian,Brown Peethala,P. Bhosale
international interconnect technology conference, pp.1-3, (2017)
R. Muralidhar,Ernest Y. Wu,Thomas M. Shaw, Andrew Kim,Baozhen Li,Paul S. McLaughlin, James H. Stathis,Griselda Bonilla
international reliability physics symposium, (2017)
international interconnect technology conference, pp.89-91, (2016)
Xunyuan Zhang,H. Huang, Raghuveer Patlolla, Wei Wang, Juntao Li,Chao-Kun Hu,E. Liniger,Paul S. McLaughlin, Cathy Labelle,E. Todd Ryan,Donald F. Canaperi,Terry A. Spooner
international interconnect technology conference, pp.31-33, (2016)
Theodorus E. Standaert, Genevieve Beique, H.-C. Chen, Shyng-Tsong Chen, B. Hamieh, Joe Lee,Paul S. McLaughlin, J. McMahon, Yann Mignot, Koichi Motoyama, Son Van Nguyen, Raghuveer Patlolla
international interconnect technology conference, pp.2-4, (2016)
international reliability physics symposium, (2016)
Siyuranga O. Koswatta, N. Mavilla,M. Bajaj,J. Johnson,S. Gundapaneni, C. Scott,G. Freeman, D. Poindexter,Paul S. McLaughlin,S. Mittl, L. Sigal,James D. Warnock
international electron devices meeting, (2015)
Takeshi Nogami, Benjamin D. Briggs, Sevim Korkmaz,Moosung M. Chae,Christopher J. Penny, Juntao Li, Wei Wang,Paul S. McLaughlin,Terence Kane,Christopher Parks,Anita Madan,S. Cohen
international electron devices meeting, (2015)
international integrated reliability workshop, pp.52-55, (2015)
Electron Devices Meeting, pp.15.3.1-15.3.4, (2013)
(2012)
Cited by5Bibtex
IEEE Transactions on Device and Materials Reliability, no. 1 (2011): 86-91
Reliability Physics Symposium, pp.2F.2.1-2F.2.8, (2011)
Shaoning Yao,Vincent Mcgahay,M Angyal,Andrew H Simon,T C Lee,Cathryn Christiansen,Baozhen Li,Fen Chen,Paul S Mclaughlin,Oluwafemi O Ogunsola, Stephan Grunow
(2011)
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