Nakwon YooDept Elect & Comp Engn Seoul Natl Univ关注立即认领分享关注立即认领分享基本信息浏览量:0职业迁徙个人简介暂无内容研究兴趣论文共 4 篇作者统计合作学者相似作者按年份排序按引用量排序主题筛选期刊级别筛选合作者筛选合作机构筛选时间引用量主题期刊级别合作者合作机构Detection of Thermal Transport on Chip Using Gate-Induced Drain Leakage CurrentNak Won Yoo,Seoungwook Choi,Jun Yeon Yun,Young June ParkJOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY(2020)引用0浏览0WOS引用00Detection of Hot Carrier Generated Phonon Using the Gate-Induced Drain Leakage in the Silicon ChipNak Won Yoo,Jun Yeon Yun,Young June ParkIEEE Transactions on Electron Devices(2018)引用0浏览0EIWOS引用00Near-Infrared Detection Using Pulsed Tunneling Junction in Silicon Devices Kim, H.,Choi, S.,Yoo, N.,Lee, M.J.IEEE Transactions on Electron Devices(2016)引用3浏览0EIWOS引用30Analysis of a modified recessed active tunneling field-effect transistorHuiJung Kim,Seongwook Choi,Nakwon Yoo,Seungman Rhee,Myoung Jin Lee,Young June ParkJAPANESE JOURNAL OF APPLIED PHYSICS(2016)引用2浏览0引用20作者统计合作学者合作机构D-Core合作者学生导师暂无相似学者,你可以通过学者研究领域进行搜索筛选数据免责声明页面数据均来自互联网公开来源、合作出版商和通过AI技术自动分析结果,我们不对页面数据的有效性、准确性、正确性、可靠性、完整性和及时性做出任何承诺和保证。若有疑问,可以通过电子邮件方式联系我们:report@aminer.cn