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Papers共 133 篇Author StatisticsCo-AuthorSimilar Experts
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Gopal Sankar Kenath,Martin Burkhardt, Nikhil Jain, Anna Lin,Jennifer Church,Gen Tsutsui, Stephanie Reynoso, Xuan Liu, Chris Sheraw,Pietro Montanini,Eric Miller,Indira Seshadri,Luciana Meli,Nelson Felix
OPTICAL AND EUV NANOLITHOGRAPHY XXXVII (2024)
Curtis Durfee, Ivo Otto IV,Subhadeep Kal,Shanti Pancharatnam,Matthew Flaugh,Toshiki Kanaki, Matthew Rednor,Huimei Zhou,Liqiao Qin,Luciana Meli,Nicolas Loubet,Peter Biolsi,Nelson Felix
ECS Transactionsno. 1 (2023): 45-52
I. Seshadri,E. Miller, J. Church, A. Chu,J. Zhang,A. Greene,J. Frougier, T. Li, Y. Cabrera, G. Kenath, M. Burkhardt,S. Skordas, L. Meli,N. Felix
Extended Abstracts of the 2023 International Conference on Solid State Devices and Materials (2023)
Curtis Durfee, Ivo Otto IV,Subhadeep Kal,Shanti Pancharatnam,Matthew Flaugh,Toshiki Kanaki, Matthew Rednor,Huimei Zhou,Liqiao Qin,Luciana Meli,Nicolas Loubet,Peter Biolsi,Nelson Felix
ECS Meeting Abstractsno. 30 (2023): 1517-1517
Shogo Mochizuki,Nicolas Loubet, Pial Mirdha,Curtis Durfee,Huimei Zhou, Gen Tsusui,Julien Frougier,Reinaldo Vega,Liqiao Qin,Nelson Felix,Dechao Guo,Huiming Bu
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (2022)
Metrology, Inspection, and Process Control XXXVI (2022)
Metrology, Inspection, and Process Control XXXVI (2022)
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Author Statistics
#Papers: 133
#Citation: 2591
H-Index: 23
G-Index: 48
Sociability: 6
Diversity: 2
Activity: 1
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