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Ming Lei received the B.S. degree in physics from the University of Science and Technology of China in 2005 and the Ph.D. degree in physics from the University of Texas at Austin in 2012.
From 2005 to 2012, he was a Research Assistant with the Physics Department, University of Texas at Austin. His research interest includes the characterization of novel electronic materials for advanced semiconductor device applications. He joined technology development with GLOBALFOUNDRIES Inc., Malta, NY, USA, since 2012, as a Principal Engineer leading-edge 300 mm fab. His work focuses on development of brightfield and SEM based in-line defect inspection methodologies for advanced technology development. He is currently a Chief Technology Officer with Femtometrix, and leading the state of the art nonlinear optics-based metrology technology for advanced logic, memory, and CMOS image sensor device manufacturing applications. He has authored over 30 articles and six patents.
Dr. Lei was a recipient of the Robert Hyer Award from the American Physics Society in 2011 for his excellence in research.
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论文共 32 篇作者统计合作学者相似作者
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ECS Meeting Abstractsno. 19 (2022): 1055-1055
Irina Ionica,D. Damianos,Anne Kaminski, D. Blanc-Pelissier,Gerard Ghibaudo,Sorin Cristoloveanu, Lionel Bastard,Aude Bouchard, Xavier Mescot, Martine Gri,Ming Lei,Brian Larzelere,
ECS Meeting Abstractsno. 1 (2020): 119-130
I. Ionica,D. Damianos,A. Kaminski-Cachopo, A. Bouchard, X Mescot, M. Gri, G. Grosa,S. Cristoloveanu,G. Vitrant, D. Blanc-Pelissier,M. Lei, J. Chanzala
D. Damianos,Guy Vitrant,A. Kaminski-Cachopo,D. Blanc-Pelissier,G. Ghibaudo,M. Lei, J. Changala, A. Bouchard, X. Mescot, M. Gri,Sorin Cristoloveanu,I. Ionica
Dimitrios Damianos,Irina Ionica, A. Kaminski,D. Blanc-Pélissier, J. Changala,Ming Lei, S. Cristoloveanu, G. Vitrant
HAL (Le Centre pour la Communication Scientifique Directe) (2017)
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D. Damianos,I. Ionica, J. Changala,M. Lei,A. Kaminski-Cachopo,D. Blanc-Pelissier, S. Cristoloveanu,G. Vitrant
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