My interests are focused upon enabling materials research at the nanoscale via the microscopy techniques of atom probe tomography (APT) and field ion microscopy (FIM). APT is a technique capable of material characterisations at the atomic-scale, in which each atom is identified chemically and located in three-dimensions with very high accuracy. Hence, it is a technique rapidly rising in prominence. The Atom Probe Group in the Department of Materials at the University of Oxford is interested and active in all areas of this research across a broad range of material systems.
In particular, I am developing a variety of new analytical techniques to improve the three dimensional reconstructions generated by APT and the subsequent atom-by-atom analysis of the resulting data. I am interested in applying these techniques to the characterisation of a wide variety of systems to inform materials research projects.