基本信息
views: 160

Bio
As the leading principal scientist for Group IV epi activities he defines and coordinates the epitaxial growth strategy to address current and future material requirements for semiconductor applications. Roger holds more than 85 patent applications (including provisional filings), he (co-) authored more than 240 papers (listed in INSPEC database) and he is co-editor of seven special journal issues (Semiconductor Science and Technology (2019), Materials Science in Semiconductor Processing (2017), Thin Solid Films (2012, 2016), Solid State Electronics (2013, 2015), and Micro Electronic Engineering (2014)). His h-factor is 33.
Research Interests
Papers共 617 篇Author StatisticsCo-AuthorSimilar Experts
By YearBy Citation主题筛选期刊级别筛选合作者筛选合作机构筛选
时间
引用量
主题
期刊级别
合作者
合作机构
Thomas Koch,Clement Godfrin, Viktor Adam,Julian Ferrero, Daniel Schroller, Noah Glaeser,Stefan Kubicek,Ruoyu Li,Roger Loo,Shana Massar,George Simion,Danny Wan,Kristiaan De Greve,Wolfgang Wernsdorfer
M. Beggiato, D. Cerbu,R. Loo, W. Sun,A. Moussa, G. Bast, K. Fukaya, C. Beral,A-L. Charley, N. Janardan, A. Cross, G. Lorusso, M. Isawa,A. Belmonte,G. Sankar Kar,J. Bogdanowicz
METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVIII (2024)
Ahmed Kandeel,Gaspard Hiblot,Clement Porret,Srinivasan Ashwyn Srinivasan,Yosuke Shimura,Roger Loo,Mathias Berciano, Chih-Kuo Neil Tseng, Dharmander Malik,Alexey Milenin,Didit Yudistira,Sadhishkumar Balakrishnan, Amir Shahin, Javad Rahimi Vaskasi,Peter Verheyen,Marianna Pantouvaki,Maumita Chakrabarti,Dimitrios Velenis,Filippo Ferraro,Yoojin Ban,Dries Van Thourhout,Joris Van Campenhout
Journal of Lightwave Technologyno. 99 (2024): 1-9
Materials Science in Semiconductor Processing (2024): 108700-108700
ECS Transactionsno. 2 (2024): 13-24
A. Vandooren, K. Stiers, C. Sheng,C. Toledo de Carvalho Cavalcante,M. Hosseini,D. Batuk, A. Peng, X. Zhou,H. Mertens,A. Veloso, A. Mingardi, S. Sarkar Kumar, R. Kumar Saroj,K. D'havé,T. Chiarella,J. Bömmels,R. Loo,E. Rosseel,C. Porret,Y. Shimura, A. Akula,S. Choudhury,V. Brissonneau,E. Dupuy, T. Sarkar,A. Peter,N. Jourdan,J.P. Soulie,K. Vandersmissen,S. Iacovo,D. Montero,E. Vrancken,F. Sebaai,P. Puttarame Gowda, K. Lai,N. Buccheri,P. Matagne,B. T. Chan, A. Sepulveda Marquez,R. Langer, I. Gyo Koo,E. Altamirano Sanchez,K. Devriendt,F. Lazzarino,J. Mitard,J. Geypen,E. Grieten, Y-F. Chen, F. Verbeek, H. Pollenus,J. Heijlen,L.P.B. Lima,F. Holsteyns,S. Subramanian,N. Horiguchi,S. Demuynck,S. Biesemans
2024 IEEE International Electron Devices Meeting (IEDM)pp.1-4, (2024)
JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3no. 4 (2024)
JAPANESE JOURNAL OF APPLIED PHYSICSno. 9 (2024)
Steven Demuynck,Victor Vega-Gonzalez,C. Toledo de Carvalho Cavalcante,L. Petersen Barbosa Lima, K. Stiers, C. Sheng,A. Vandooren,M. Hosseini, X. Zhou,Hans Mertens,Thomas Chiarella,Jürgen Bömmels,Roger Loo,E. Rosseel,Clement Porret,Y. Shimura, A. Akula,G. Mannaert,S. Choudhury,V. Brissonneau,E. Dupuy, T. Sarkar,Nathali Franchina-Vergel,A. Peter,Nicolas Jourdan,J. P. Soulie,Kevin Vandersmissen,F. Sebaai,P. Puttarame Gowda, K. Lai, A. Mingardi, S. Sumar Sarkar,K. D'Have,B. T. Chan, A. Sepulveda Marquez,R. Langer, I. Gyo Koo,E. Altamirano Sanchez,Katia Devriendt, P. Rincon Delgadillo,F. Lazzarino,Jérôme Mitard,J. Geypen,E. Grieten,D. Batuk, Y.-F. Chen, F. Verbeek,F. Holsteyns,S. Subramanian,N. Horiguchi,S. Biesemans
Symposium on VLSI Technologypp.1-2, (2024)
Load More
Author Statistics
#Papers: 617
#Citation: 9932
H-Index: 42
G-Index: 65
Sociability: 8
Diversity: 3
Activity: 20
Co-Author
Co-Institution
D-Core
- 合作者
- 学生
- 导师
Data Disclaimer
The page data are from open Internet sources, cooperative publishers and automatic analysis results through AI technology. We do not make any commitments and guarantees for the validity, accuracy, correctness, reliability, completeness and timeliness of the page data. If you have any questions, please contact us by email: report@aminer.cn