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个人简介
Chen Liu was born in Hengshui, China, in 1986. He received the B.Eng. and M.Eng. degrees in measuring and testing technologies and instruments from Xidian University, Xi’an, China, in 2009 and 2012, respectively.
In 2012, he joined the Department of Metrology and Maintenance, Hebei Semiconductor Research Institute, Shijiazhuang, China, as a Research Engineer. From April to October 2017, he was a Visiting Researcher with the National Physical Laboratory, Teddington, U.K. His current research interests include the design and characterizing of on-wafer short-open-load-thru (SOLT) and thru-reflect-line (TRL)
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-parameters calibration kits, the development of accurate on-wafer
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-parameters and noise parameter measurement techniques, and the verification of on-wafer
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-parameters and noise parameter using active and passive devices.
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