Lira HwangTechnology Quality Reliability Quality & Reliability Team Samsung Electronics Co., Ltd关注立即认领分享关注立即认领分享基本信息浏览量:0职业迁徙个人简介暂无内容研究兴趣论文共 2 篇作者统计合作学者相似作者按年份排序按引用量排序主题筛选期刊级别筛选合作者筛选合作机构筛选时间引用量主题期刊级别合作者合作机构Reliability characterizations of display driver IC on High-k/ metal-gate technologyDong-Hoon Kim,Jungdong Kim,Kidan Bae,Hye-jin Kim,Lira Hwang,Sang-chul Shin, Hyung-Nyung Park, Intaek Ku,Jongwoo Park,Sangwoo Pae,Haebum Lee2016 IEEE International Reliability Physics Symposium (IRPS)(2016)引用3浏览0EIWOS引用30Experimental study on BTI variation impacts in SRAM based on high-k/metal gate FinFET: From transistor level Vth mismatch, cell level SNM to product level VminChangze Liu, Hyeonwoo Nam,Kangjung Kim,Seungjin Choo,Hye-jin Kim,Hyun-Jin Kim,Yoohwan Kim,Soonyoung Lee,Sungyoung Yoon,Jungin Kim,Jin Ju Kim,Lira Hwang,2015 IEEE International Electron Devices Meeting (IEDM)(2015)引用10浏览0EIWOS引用100作者统计合作学者合作机构D-Core合作者学生导师暂无相似学者,你可以通过学者研究领域进行搜索筛选数据免责声明页面数据均来自互联网公开来源、合作出版商和通过AI技术自动分析结果,我们不对页面数据的有效性、准确性、正确性、可靠性、完整性和及时性做出任何承诺和保证。若有疑问,可以通过电子邮件方式联系我们:report@aminer.cn