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Kaushal Nigam received the B.Tech. degree from the Department of Electronics and Communication Engineering, Madan Mohan Malaviya University of Technology Gorakhpur, India, in 2009, the M.Tech. degree from the Department of Electronics and Communication Engineering, Maulana Azad National Institute of Technology Bhopal, India, in 2011, and the Ph.D. degree from the Department of Electronics and Communication Engineering, PDPM Indian Institute of Information Technology, Design and Manufacturing Jabalpur, India, in 2018. He is an Assistant Professor (Senior Grade) with the Department of Electronics and Communication Engineering, Jaypee Institute of Information Technology, Noida, India. He has published various research papers in several international journals, conferences, and book chapters. He has also experience of more than 8 years in teaching and research activities in various technical universities in India. His research interests include field effect transistor-based devices and its applications. He is a Reviewer of various reputed international journals, including IEEE Transactions on Electron Devices, IET Circuits, Devices and Systems, IET Micro & Nano Letters, the Journal of Computational Electronics, Applied Physics A, Superlattices and Microstructures, Silicon, and the Journal of Nanoelectronics & Optoelectronics.
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JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS (2024)
Kaushal Kumar Nigam, Dharmender
Microelectronics Reliability (2024): 115357
INTERNATIONAL JOURNAL OF ELECTRONICSno. 4 (2024): 599-615
2023 9th International Conference on Signal Processing and Communication (ICSC)pp.663-668, (2023)
2023 First International Conference on Advances in Electrical, Electronics and Computational Intelligence (ICAEECI)pp.1-8, (2023)
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2023 9th International Conference on Signal Processing and Communication (ICSC)pp.679-683, (2023)
2023 7th International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech)pp.1-6, (2023)
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