Her main field of interest is electronic materials science – studying the effects of defects on the properties of semiconductor materials and devices. She has worked on strain relaxation in lattice-mismatched semiconductor heterostructures, diffusion barriers and electrical contacts for silicon and III-V semiconductor based devices, epitaxial growth and nucleation, and electron transport through thin films and interfaces. Her work on characterization tools including electron microscopy, Rutherford backscattering, x-ray diffraction, and scanning probe microscopy.