Jun Chen

Jun Chen Jun Chen received the B.S. (2000) and Ph.D. (2005) degrees in Material Science and Engineering from Zhejiang University, China. In 2005, she worked as post-doctoral in National Institute for Materials Science (NIMS), Japan. From 2008, she worked as ICYS (International Center for Young Scientists) researcher in International Center for Materials Nanoarchitechtonics. She mainly engaged in the defect characterizations in semiconductor materials and devices. Her current subject includes the study of leakage and breakdown processes in high-k gate dielectrics by using electron-beam-induced current technique.