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Dr. John Palmour co-founded Cree in 1987, now a more-than-$1-billion company and market-leading innovator transforming what's possible in LED technology, LED lighting, and semiconductor products for power and radio frequency (RF) applications. At the onset, he knew Cree had the opportunity to define the market with the blue LED and had the cutting-edge vision to transform power devices. As CTO of Cree’s high-potential power and RF business units, John focuses on pioneering breakthrough semiconductor technology for power and RF commercial applications, businesses central to Cree from the start, even before the company built its LED lighting empire. Embodying the risk-taking and relentless reinventing culture that Cree was founded upon, John has helped Cree transform the traditionally slow-moving and risk-averse power and RF industries with a no-such-thing-as impossible approach to innovation. Today, Cree’s power and RF businesses grow at a rate of about 20 percent a year, with a bright future ahead.
He has been responsible for 70 U.S. patents in the areas of processing and device designs for silicon carbide and gallium nitride electronic devices.
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论文共 435 篇作者统计合作学者相似作者
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In-Hwan Ji, Anoop Mathew,Jae-Hyung Park, Neal Oldham,Matthew McCain,Shadi Sabri,Edward Van Brunt,Brett Hull,Daniel J. Lichtenwalner,Donald A. Gajewski,John W. Palmour
IRPSpp.1-4, (2023)
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Daniel J. Lichtenwalner,Satyaki Ganguly, Brian Fetzer, Callie Marie Woods, D. A. Gajewski,Sei-Hyung Ryu,Brett Hull,Scott T. Allen,John W. Palmour
Key Engineering Materials (2023): 95-99
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Materials Science Forum (2023): 93-100
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Materials Science Forum (2023): 179-186
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user-61447a76e55422cecdaf7d19(2022)
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Satyaki Ganguly,Daniel J. Lichtenwalner, Caleb Isaacson,Donald A. Gajewski,Philipp Steinmann, Ryan Foarde,Brett Hull,Sei-Hyung Ryu,Scott Allen,John W. Palmour
2022 IEEE International Reliability Physics Symposium (IRPS)pp.8B.1-1-8B.1-6, (2022)
Satyaki Ganguly,Kyle M. Bothe,Alexandre Niyonzima,Thomas Smith,Yueying Liu,Jeremy Fisher, Fabian Radulescu,Donald A. Gajewski,Scott T. Sheppard, Jim W. Milligan,Basim Noori,John W. Palmour
IEEE International Reliability Physics Symposium (IRPS)pp.1-11, (2022)
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