John J. Boeckl

John J. Boeckl received the B.S. and M.S. degrees in electrical engineering from Cleveland State University, Cleveland, OH, in 1989 and 1997, respectively, where he is currently pursuing the Ph.D. degree on the structural and electrical characterization of III-V on group IV heteroepitaxy. From 1989 to 1996 he was a Civilian Employee with the U.S. Air Force at Newark Air Force Base, Newark, OH, managing and operating a failure analysis laboratory for semiconductor components. In 1996, he was awarded a Palace Knight position through Wright Patterson Air Force Base (WPAFB), Dayton, OH. Currently, he is a Research Scientist at the Air Force Research Laboratory's Materials and Manufacturing Directorate, WPAFB, where his studies focus on the development of nanomaterials and their characterization with electron microscopy.