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Jaume Segura (M'94) received the M.S. and Ph.D. degrees from the Balearic Island University and the Polytechnic University of Catatonia in Spain, respectively.
Since 1993, he has been an Associate Professor in the Physics Department, Balearic Islands University (UIB), Palma de Mallorca, Spain. He was on leave from UIB in 1994 and 2001 as an Invited Reasearcher at Philips Semiconductors, USA, and Intel Corporation, respectively. His research interests include device and circuit modeling and VLSI design and testing.
Dr. Segura has served on the technical program committee of a number of conferences including the Design and Test in Europe (DATE), the International On-Line Testing Workshop (IOLTW), and the International workshop on current and Defect Based Testing (DBT). He is also member of the organizing committee of the VLSI Test Symposium (VTS) and served as General Co-Chair of the IOLTW in 2000.
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论文共 155 篇作者统计合作学者相似作者
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Sensors and Actuators A: Physicalpp.115435, (2024)
2023 22nd International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers)pp.144-147, (2023)
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2023 IEEE 36th International Conference on Micro Electro Mechanical Systems (MEMS)pp.795-798, (2023)
2023 38TH CONFERENCE ON DESIGN OF CIRCUITS AND INTEGRATED SYSTEMS, DCISpp.1-6, (2023)
2023 22nd International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers)pp.513-516, (2023)
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2022 IEEE Sensorspp.1-4, (2022)
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