基本信息
浏览量:44
职业迁徙
个人简介
RESEARCH INTERESTS:
BROADBAND AND RF/MICROWAVE MEASUREMENT AND DIELECTRIC CHARACTERIZATION TECHNIQUES, METROLOGY AND CHARACTERIZATION OF GRAPHENE AND 2D SEMICONDUCTORS. POLYMER COMPOSITES, NANOCELLULOSE.
Professional Activities:
IEC TC 113 Nanotechnology for Electrotechnical Products and Systems.
US Delegate to IEC, Technical expert, Project leader
ISO TC 229 Nanotechnologies, Member
IPC TC D60 Printed/Flexible Electronics, Observer
Chair, IPC D-54 Test Method Subcommittee for Embedded Electronic Materials & Devices, Association Connecting Electronic Industries (IPC).
Co-Chair, National Roadmap for Organic and Printed Electronics, International Electronic Manufacturing Initiative (iNEMI ).
BROADBAND AND RF/MICROWAVE MEASUREMENT AND DIELECTRIC CHARACTERIZATION TECHNIQUES, METROLOGY AND CHARACTERIZATION OF GRAPHENE AND 2D SEMICONDUCTORS. POLYMER COMPOSITES, NANOCELLULOSE.
Professional Activities:
IEC TC 113 Nanotechnology for Electrotechnical Products and Systems.
US Delegate to IEC, Technical expert, Project leader
ISO TC 229 Nanotechnologies, Member
IPC TC D60 Printed/Flexible Electronics, Observer
Chair, IPC D-54 Test Method Subcommittee for Embedded Electronic Materials & Devices, Association Connecting Electronic Industries (IPC).
Co-Chair, National Roadmap for Organic and Printed Electronics, International Electronic Manufacturing Initiative (iNEMI ).
研究兴趣
论文共 106 篇作者统计合作学者相似作者
按年份排序按引用量排序主题筛选期刊级别筛选合作者筛选合作机构筛选
时间
引用量
主题
期刊级别
合作者
合作机构
LANGMUIRno. 16 (2024): 8562-8567
Jeffrey W. Gilman,Quinn T. Easter,Shawn H. Chen, Stephan J. Stranick,Douglas M Fox,Jan Obrzut,Amanda J. Souna, Huyen Vu,Sindhu Seethamraju,E. Bryan Coughlin,Jeremiah W. Woodcock
ECS Meeting Abstractsno. 59 (2020): 3018-3018
ECS Meeting Abstractsno. 9 (2019): 699-699
加载更多
作者统计
合作学者
合作机构
D-Core
- 合作者
- 学生
- 导师
数据免责声明
页面数据均来自互联网公开来源、合作出版商和通过AI技术自动分析结果,我们不对页面数据的有效性、准确性、正确性、可靠性、完整性和及时性做出任何承诺和保证。若有疑问,可以通过电子邮件方式联系我们:report@aminer.cn