Research Summary: My major research and development interests involve using interferometric techniques combined with computers and modern electronics to produce "state of the art" solutions for a variety of metrology problems. Particular interests are: Demonstrating the use of microcomputers, software and interferometric techniques for measurements of optical components and optical systems, measurement of supersmooth (1 Angstrom rms or less) optical surfaces; absolute measurements of surfaces; measurement of optically rough surfaces; testing of complex aspheric surfaces; dynamic interferometers for precision surface roughness and shape measurements in manufacturing environments and the shape measurement of vibrating surfaces. Development of commercial optical test equipment based on phase-shifting interferometry for solving metrology problems in many industries including data storage, semiconductor, machine tool, optical fabrication, fiber optics, printing and biomedical.