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职业迁徙
个人简介
Current Research
By making full use of layer-controlled thin film technology and introducing structures and organizations that cannot be obtained in thermal equilibrium, we have been searching for novel functions and properties that involve enormous effects. We have also developed microscopic evaluation methods such as scanning probe microscopes and are working to figure out the nature of electronic and chemical inhomogeneity that controls properties. Furthermore, we are engaged in controlling the surfaces precisely on which the assembly patterns of molecules and atoms are handled into desired structures that enables novel device structures to be developed.
Keywords
Atomic Layer Control, Nanotechnology, Thin Film, Scanning Probe Microscope, Solid State Physical Property, Magnetic Property, Superconductivity, Surface, Electronic Device
Solid State Chemistry/Material Characterization
(1) Development of Functional Electronic Materials
(2) Characterization of Electronic Properties Using Scanning Probes
(3) Development of Nanotechnology-assisted Chemistry
Awards:
1988 Spectrochim Acta Atomic Spectroscopy Award, Pergamon Press
1991 Award B, Japan Society of Applied Physics
1995 Nissan Technology Award, Nissan Science Foundation
2002 Superconductor Science and Technology Award, The Society of Non-traditional Technology
By making full use of layer-controlled thin film technology and introducing structures and organizations that cannot be obtained in thermal equilibrium, we have been searching for novel functions and properties that involve enormous effects. We have also developed microscopic evaluation methods such as scanning probe microscopes and are working to figure out the nature of electronic and chemical inhomogeneity that controls properties. Furthermore, we are engaged in controlling the surfaces precisely on which the assembly patterns of molecules and atoms are handled into desired structures that enables novel device structures to be developed.
Keywords
Atomic Layer Control, Nanotechnology, Thin Film, Scanning Probe Microscope, Solid State Physical Property, Magnetic Property, Superconductivity, Surface, Electronic Device
Solid State Chemistry/Material Characterization
(1) Development of Functional Electronic Materials
(2) Characterization of Electronic Properties Using Scanning Probes
(3) Development of Nanotechnology-assisted Chemistry
Awards:
1988 Spectrochim Acta Atomic Spectroscopy Award, Pergamon Press
1991 Award B, Japan Society of Applied Physics
1995 Nissan Technology Award, Nissan Science Foundation
2002 Superconductor Science and Technology Award, The Society of Non-traditional Technology
研究兴趣
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JAPANESE JOURNAL OF APPLIED PHYSICSno. 6 (2023)
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The Japan Society of Applied Physics (2021)
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The Japan Society of Applied Physics (2021)
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The Japan Society of Applied Physics (2021)
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The Japan Society of Applied Physics (2021)
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