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Dimitris Ioannou has authored or co-authored over two hundred and fifty research papers and conference presentations and advised more than thirty research students. His main research contributions include the development of techniques for using scanning electron microscopy (SEM) and Electron-beam-induced current (EBIC) to detect and characterize defects in semiconductor materials; techniques for studying deep traps, carrier lifetime and interface states in Silicon on Insulator (SOI) substrates; physics and hot carrier reliability of SOI devices, including the discovery of the opposite-channel based carrier-injection and invented an SOI flash memory cell that exploits this phenomenon; development of Schottky and Ohmic contact technology for SiC. His current research interests are on the performance and reliability issues of SOI and bulk CMOS devices and circuits (radiation hardness, hot carriers, negative bias temperature instability, electrostatic discharge protection), and on non-classical (nano-scale) CMOS and the emerging field of nanoelectronics, including nanowire-based non-volatile memory. Ioannou has been involved with the IEEE Intern SOI Conference for over fifteen years, including as technical program chairman (SOI’2001) and general chairman (SOI’2002). He is the 2008 Outstanding Research Faculty Award Recipient of the George Mason University College of Engineering and Computing. He is a Fellow of the IEEE, and in recognition of the importance of his research to the semiconductor industry, he is a two-time recipient of the IBM faculty award.
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论文共 176 篇作者统计合作学者相似作者
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IEEE Transactions on Electron Devicesno. 99 (2024): 1-7
IEEE Transactions on Electron Devicespp.1-7, (2024)
IEEE Transactions on Electron Devicesno. 9 (2023): 4899-4904
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ECS Meeting Abstractsno. 36 (2022): 1324-1324
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Yafen Yang,Kai Zhang,Yi Gu,Parameswari Raju,Qiliang Li,Li Ji,Lin Chen,Dimitris E. Ioannou,Qingqing Sun, David Wei Zhang,Hao Zhu
2022 INTERNATIONAL ELECTRON DEVICES MEETING, IEDMpp.22.6.1-22.6.4, (2022)
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ECS Meeting Abstractsno. 30 (2019): 1331-1331
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