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个人简介
Claude Ortolland GLOBALFOUNDRIES, Hopewell Junction, NY 12533
USA (claude.ortolland@globalfoundries.com). Dr. Ortolland was born in Chambéry, France, and received
the engineer degree in materials, an M.S. degree in microelectronics, in 2003, and a Ph.D. degree in 2006 from the
Institut National des Sciences Appliqués. From 2003 to 2007, he was with NXP Semiconductors working on
reliability and device integration, and finally on yield enhancement for 90/65/45-nm CMOS technologies. In 2007, he
joined the Interuniversity Microelectronics Center (IMEC) as a Device Engineer for Advanced CMOS technology. Since
2010, he has been working as Device Engineer at IBM and then GLOBALFOUNDRIES. He is author or coauthor of 7 patents
and more than 40 technical papers.
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论文共 4 篇作者统计合作学者相似作者
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Scott R. Stiffler,Ravikumar Ramachandran, W. Kirklen Henson, Noah D. Zamdmer,Kevin McStay,Giuseppe La Rosa,Kevin M. Boyd,Sungjae Lee,Claude Ortolland,Paul C. Parries
European Microscopy Congress 2016: Proceedingspp.584-585, (2016)
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