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个人简介
Christopher I. Lang was born in Boston, MA, USA, in 1993. He received the B.S. and M.Eng. degrees in electrical engineering and computer science from the Massachusetts Institute of Technology in 2015 and 2017, respectively.
From 2013 to 2015, he was an Undergraduate Research Assistant with the Quantum Nanostructures and Nanofabrication Group. In 2015, he joined the Statistical Metrology Group with MIT. His research mainly focuses on modeling pattern dependent variations in semiconductor fabrication processes.
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Christopher Lang,Fan-Keng Sun, Bruce Lawler, Jack Dillon, Ash Al Dujaili, John Ruth, Peter Cardillo, Perry Alfred, Alan Bowers, Adrian Mckiernan,Duane S. Boning
Annual Conference on Neural Information Processing Systems (2021): 29806-29819
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Frontiers in Optics (2019)
2018 29TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE (ASMC)pp.238.0-243.0, (2018)
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