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Proceedings (2023)
Hee-Beom Lee, Masahiro Ishimaru, John McPhillips,Roger L. Alvis,Timothy A. Johnson,Christopher H. Kang, Inchang Choi, Youngjin Cho, Kiju Choi
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)pp.1-5, (2022)
International Symposium for Testing and Failure Analysis ISTFA 2022: Conference Proceedings from the 48th International Symposium for Testing and Failure Analysis (2022)
International Symposium for Testing and Failure AnalysisISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis (2021)
International Symposium for Testing and Failure AnalysisISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis (2021)
Neel Leslie,Brian Lai, Heebeom Lee, Mingi Lee,Christopher H. Kang, Zuzana Patakova, Frantisek Zelenka,Trond Varslot
International Symposium for Testing and Failure AnalysisISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis (2020)
International Symposium for Testing and Failure AnalysisISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis (2020)
Anne Kenslea,Chris Hakala,Zhenxin Zhong,Yinggang Lu, John Fretwell, Jack Hager,Chris Kang,Haiyan Tan,Weihao Weng,Laurent Dumas,Irene Brooks
Haiyan Tan,Weihao Weng, Raghaw Rai,Chris Kang,Laurent Dumas,Irene Brooks,Ahmad Katnani,Zhenxin Zhong,Chris Hakala,Yinggang Lu, John Fretwell,Timothy A. Johnson
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