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论文共 45 篇作者统计合作学者相似作者

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Systematic Investigation on the Performance and Reliability of 4H-Sic MOSFETs with Nonkiller Epitaxial Morphological Defects
Yibo Zhang,Xiaoyan Tang,Hao Yuan, Jingkai Guo,Haohang Yang,Yu Zhou, Fengyu Du, Keyu Liu, Zhiwen Zhang, Chenyu Wang, Aijun Zhang,Qingwen Song,Chao Han,Yuming Zhang
IEEE Transactions on Electron Devicesno. 99 (2025): 1-7
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Microscopic Study of 3D Potts Phase Transition Via Fuzzy Sphere Regularization
Shuai Yang, Yan-Guang Yue, Yin Tang,Chao Han, W. Zhu,Yan Chen
arxiv（2025）
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Comparsion of SiC Planar and Trench Junction Barrier Schottky Diode with Surge Current Capability
Zi-Ming Zhao, Yan-Cong Liu,Hao Yuan, Feng-Yu Du,Yu Zhou,Ke-Yu Liu,Xiao-Yan Tang,Chao Han, Qing-Wen Song,Yu-Ming Zhang
2024 IEEE 17th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)pp.1-3, (2024)
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Analysis of the Separation Degree for P-Pillar in SiC Super-Junction Structure Through “multiple Epitaxy-Ion Implantation” Route
Hao-Bo Kang,Hao Yuan, Feng-Yu Du,Yu Zhou,Ke-Yu Liu,Xiao-Yan Tang,Chao Han, Qing-Wen Song,Yu-Ming Zhang
2024 IEEE 17th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)pp.1-3, (2024)
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High-Temperature Oxidation of 4H-Sic and Gate Oxide Reliability Dependence on Oxidation Temperature
Baoyan Feng,Xiaoyan Tang, Yi bo Zhang,Chao Han,Hao Yuan, Qing wen Song
2024 IEEE 17th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)pp.1-3, (2024)
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作者统计

#Papers: 45

#Citation: 281

H-Index: 9

G-Index: 16

Sociability: 5

Diversity: 2

Activity: 8

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