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排名必读论文期刊顶会热点AI 简史溯源树小脉星探人才迁徙塔尖人才国防情报追踪开源工具智慧手语
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论文共 28 篇作者统计合作学者相似作者

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Modulation Of HCI in I/O analog devices Through Process Specifications
C. Diouf,X. Federspiel, A. Bravaix, C. Doyen, V. Yon, L. Basset, X. Garros
2023 IEEE International Integrated Reliability Workshop (IIRW)pp.1-8, (2023)
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40-nm RFSOI technology exhibiting 90fs RON × COFF and fT/fMAX of 250 GHz/350 GHz targeting sub-6 GHz and mmW 5G applications
S. Crémer,N. Pelloux, F. Gianesello, Y. Mourier, G. Haury, Tulio Chaves de Albuquerque, Frederic Monsieur, H. Audouin, C. A. Legrand,C. Diouf, J. Azevedo Goncalves, C. Belem Goncalves,
ESSDERCpp.101-104, (2023)
引用0浏览0EI引用
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Modulation Of HCI in I/O analog devices Through Process Specifications
C. Diouf,X. Federspiel, A. Bravaix, C. Doyen, V. Yon, L. Basset, X. Garros
2023 IEEE International Integrated Reliability Workshop (IIRW) (2023)
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40-nm RFSOI technology exhibiting 90fs RON x COFF and fT/ fMAX of 250 GHz/350 GHz targeting sub-6 GHz and mmW 5G applications
S. Cremer,N. Pelloux, F. Gianesello, Y. Mourier, G. Haury,T. Chaves de Albuquerque, F. Monsieur, H. Audouin, C. A. Legrand,C. Diouf, J. Azevedo Goncalves, C. Belem Goncalves,
IEEE 53RD EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE, ESSDERC 2023pp.101-104, (2023)
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Insight Into HCI Reliability on I/O Nitrided Devices
C. Doyen, V. Yon,X. Garros,L. Basset,T. Mota Frutuoso, C. Dagon,C. Diouf,X. Federspiel, V. Millon, F. Monsieur, C. Pribat,D. Roy
IRPSpp.1-5, (2023)
引用1浏览0EIWOS引用
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0.13 μm HR SiGe BiCMOS Technology exhibiting 169 fs Ron x Coff Switch Performance targeting WiFi 6E Fully-Integrated RF Front-End-IC Solutions
F. Gianesello, C. Charbuillet, N. Derrier, D. Muller,C. Diouf, D. Ney, C. Deglise-Favre, I. Sicard, M. Ali Nsibi, R. Debroucke, M. Buczko, C.A. Legrand,
2022 International Electron Devices Meeting (IEDM) (2022)
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0.13 mu m HR SiGe BiCMOS Technology exhibiting 169 fs R-on x C-off Switch Performance targeting WiFi 6E Fully-Integrated RF Front-End-IC Solutions
F. Gianesello, C. Charbuillet, N. Derrier, D. Muller,C. Diouf,D. Ney, C. Deglise-Favre, I. Sicard,M. Ali Nsibi, R. Debroucke, M. Buczko, C. A. Legrand,
2022 INTERNATIONAL ELECTRON DEVICES MEETING, IEDM (2022)
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0.13 μm HR SiGe BiCMOS Technology exhibiting 169 fs Ron x Coff Switch Performance targeting WiFi 6E Fully-Integrated RF Front-End-IC Solutions
F. Gianesello, C. Charbuillet, N. Derrier, D. Muller,C. Diouf,D. Ney, C. Deglise-Favre, I. Sicard,M. Ali Nsibi, R. Debroucke, M. Buczko, C.A. Legrand,
2022 International Electron Devices Meeting (IEDM)pp.11.7.1-11.7.4, (2022)
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