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论文共 34 篇作者统计合作学者相似作者
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2025 IEEE 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)pp.139-144, (2025)
2024 IEEE 24TH INTERNATIONAL CONFERENCE ON NANOTECHNOLOGY, NANO 2024pp.620-625, (2024)
IEEE/IFIP International Conference on Very Large Scale Integration of System-on-Chippp.1-4, (2024)
IEEE/IFIP International Conference on Very Large Scale Integration of System-on-Chippp.1-4, (2024)
Ian O'Connor,Sara Mannaa,Alberto Bosio,Bastien Deveautour,Damien Deleruyelle, Tetiana Obukhova,Cedric Marchand,Jens Trommer,Cigdem Cakirlar,Bruno Neckel Wesling,Thomas Mikolajick,Oskar Baumgartner,Mischa Thesberg,David Pirker, Christoph Lenz,Zlatan Stanojevic,Markus Karner,Guilhem Larrieu,Sylvain Pelloquin, Konstantinous Moustakas,Jonas Muller,Giovanni Ansaloni,Alireza Amirshahi,David Atienza,Jean-Luc Rouas,Leila Ben Letaifa,Georgeta Bordea,Charles Brazier,Chhandak Mukherjee,Marina Deng, Yifan Wang,Marc Francois,Houssem Rezgui,Reveil Lucas,Cristell Maneux
2024 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, DATE (2024)
2024 27TH INTERNATIONAL SYMPOSIUM ON DESIGN & DIAGNOSTICS OF ELECTRONIC CIRCUITS & SYSTEMS, DDECSpp.19-24, (2024)
Marcello Traiola,Salvatore Pappalardo,Ali Piri,Annachiara Ruospo,Bastien Deveautour,Ernesto Sanchez,Alberto Bosio,Sepide Saeedi,Alessio Carpegna, Aml Bayram Gogebakan, Enrico Magliano,Alessandro Savino
IEEE EUROPEAN TEST SYMPOSIUM, ETS 2024 (2024)
IEEE International Conference on Design, Test and Technology of Integrated Systemspp.1-5, (2024)
IEEE International Conference on Design, Test and Technology of Integrated Systemspp.1-6, (2024)
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作者统计
#Papers: 34
#Citation: 68
H-Index: 5
G-Index: 7
Sociability: 5
Diversity: 2
Activity: 2
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