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Ultra High Resolution Electron Microscopy. Image Simulation and Processing. The investigation of new approaches to quantitative microscopy (theory and experiment). The development of new detectors for imaging with high energy electrons. Aberration Corrected Electron Optics. Imaging radiation sensitive materials. Phase retrieval using electron Ptychography.
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论文共 389 篇作者统计合作学者相似作者
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ULTRAMICROSCOPY (2024): 113882-113882
Dieter Weber,David Landers,Chen Huang,Emanuela Liberti,Emiliya Poghosyan, Matthew Bryan,Alexander Clausen, Daniel G. Stroppa,Angus I. Kirkland, Elisabeth Müller,Andrew Stewart,Rafal E. Dunin-Borkowski
arxiv(2024)
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Wei Mao, Weiyang Zhang,Chen Huang,Liqi Zhou,Judy. S. Kim,Si Gao, Yu Lei, Xiaopeng Wu,Yiming Hu,Xudong Pei,Weina Fang, Xiaoguo Liu,
arxiv(2024)
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Yoshie Murooka, William Bryan,James Clarke, Michael Ellis,Angus I Kirkland,Simon Maskell,Julian McKenzie,B Layla Mehdi,R J Dwayne Miller, Timothy C Q Noakes,Ian Robinson,Sven L M Schroeder,
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canadano. Supplement_1 (2023): 1487-1488
Nature Communicationsno. 1 (2023): 1-10
Nano lettersno. 15 (2023): 6807-6814
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P. X., Liqun Zhou,Chen Huang,Mark Boyce,Judy Kim,Emanuela Liberti, Yu‐Chen Hu, Takahiro Sasaki,Peter D. Nellist,Peijun Zhang, David I. Stuart,Angus I. Kirkland,
EMPIAR dataset (2023)
npj Computational Materialsno. 1 (2023): 1-12
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