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Over the years, Dr. Ivanov has served on steering, program, and/or organization committees of several international events sponsored by the IEEE or the ACM. He chaired the IEEE Computer Society Test Technology Council (TTTC) for the term 2004-2007. He has served on the Board of Governors of the IEEE Computer Society and on the Board of Governors of the IEEE Technology Management Council. He was Technical Program Chair of the VLSI Test Symposium (VTS) in 2001 and 2002 and the General Chair of VTS in 2003 and 2004. He has served as Associate Editor for the IEEE Transactions on CAD, and for the IEEE Design and Test of Computers Magazine, and for the Journal of Electronic Test: Theory and Applications (JETTA). He served as Editor in Chief of IEEE Design and Test from 2012 to 2016. In 2008, he chaired the IEEE Computer Society Fellows Committee. In 2023 he has been appointed to serve as co-Editor in Chief for the Elsevier Journal Microelectronics Reliability.
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2023 IEEE 41st VLSI Test Symposium (VTS)pp.1-7, (2023)
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2022 23rd International Symposium on Quality Electronic Design (ISQED)pp.1-6, (2022)
Energy Efficient Computing & Electronicspp.51-66, (2019)
2019 ACM/IEEE 1st Workshop on Machine Learning for CAD (MLCAD)pp.1-6, (2019)
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