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He is currently a James B. Davis Professor of Electrical and Computer Engineering at Auburn University, Auburn, AL, where he directs the VLSI Design and Test Laboratory. He has held faculty positions at the University of Massachusetts, Amherst, and Virginia Tech. His research interests include VLSI design, test, and reliability.,Dr. Singh has served as General Chair for the 2000 IEEE Very Large Scale Integration (VLSI) Test Symposium, the 2003 IEEE International Workshop on Memory Technology, Design, and Test, and the 2004 IEEE International Workshop on Defect Based Testing. He is currently Vice Chair of the IEEE Test Technology Technical Council (TTTC) and a member the IEEE Computer Society's Technical Activities Board (TAB). He also serves on the Editorial Boards of IEEE Design and Test and JETTA. He is a Golden Core Member of the IEEE Computer Society.
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LATSpp.1-2, (2023)
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2023 IEEE 41st VLSI Test Symposium (VTS)pp.1-12, (2023)
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