We have installed and running state-of-the-art aberration corrected low energy electron microscope attached to a synchrotron beam-line. The microscope performance is quite impressive and spatial resolution of about 2nm in LEEM mode has been achieved.

Skills and Expertise
Graphene
Material Characterization
Surface Characterization
Surface Science
Nanomaterials
Condensed Matter Physics
Solid State Physics
Thin Films
Materials Science
Carbon Nanotubes